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IEC 60749:1996 ED2

Semiconductor devices - Mechanical and climatic test methods

Publication date:   Apr 10, 2002

95.99 Withdrawal of Standard   May 21, 2004

General information

95.99 Withdrawal of Standard   May 21, 2004

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Life cycle

PREVIOUSLY

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IEC 60749:1984 ED1

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IEC 60749:1984/AMD1:1991 ED1

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IEC 60749:1984/AMD2:1993 ED1

NOW

WITHDRAWN
IEC 60749:1996 ED2
95.99 Withdrawal of Standard
May 21, 2004

CORRIGENDA / AMENDMENTS

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IEC 60749:1996/AMD1:2000 ED2

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IEC 60749:1996/AMD2:2001 ED2

REVISED BY

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IEC 60749-3:2002 ED1

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IEC 60749-4:2002 ED1

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IEC 60749-7:2002 ED1

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IEC 60749-9:2002 ED1

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IEC 60749-10:2002 ED1

PUBLISHED
IEC 60749-11:2002 ED1

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IEC 60749-12:2002 ED1

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IEC 60749-13:2002 ED1

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IEC 60749-21:2004 ED1

PUBLISHED
IEC 60749-19:2003 ED1

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IEC 60749-6:2002 ED1

PUBLISHED
IEC 60749-36:2003 ED1

PUBLISHED
IEC 60749-14:2003 ED1

PUBLISHED
IEC 60749-25:2003 ED1

PUBLISHED
IEC 60749-24:2004 ED1

PUBLISHED
IEC 60749-8:2002 ED1

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IEC 60749-20:2002 ED1

PUBLISHED
IEC 60749-31:2002 ED1

PUBLISHED
IEC 60749-22:2002 ED1

PUBLISHED
IEC 60749-32:2002 ED1

PUBLISHED
IEC 60749-1:2002 ED1

WITHDRAWN
IEC 60749-15:2003 ED1

WITHDRAWN
IEC 60749-5:2003 ED1

PUBLISHED
IEC 60749-2:2002 ED1