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IEC 60749:1984 ED1

Semiconductor devices - Mechanical and climatic test methods. IEC 60749:1984 ED1

Publication date:   Dec 30, 1984

General information

99.60 Withdrawal effective   Oct 28, 1996

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

Revised

Language in which you want to receive the document.

Scope

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60147-5:1977 ED1

WITHDRAWN
IEC 60147-5A:1981 ED1

NOW

WITHDRAWN
IEC 60749:1984 ED1
99.60 Withdrawal effective
Oct 28, 1996

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60749:1984/AMD1:1991 ED1

WITHDRAWN
IEC 60749:1984/AMD2:1993 ED1

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2