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IEC 60749:1984/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods. IEC 60749:1984/AMD1:1991 ED1

Publication date:   Dec 20, 1991

General information

99.60 Withdrawal effective   Oct 28, 1996

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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WITHDRAWN
IEC 60749:1984 ED1

NOW

WITHDRAWN
IEC 60749:1984/AMD1:1991 ED1
99.60 Withdrawal effective
Oct 28, 1996

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2