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IEC 60147-5:1977 ED1

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 5: Mechanical and climatic test methods IEC 60147-5:1977 ED1

Publication date:   Jan 1, 1977

General information

99.60 Withdrawal effective   Nov 19, 2016

IEC

TC 47

International Standard

31.080.10   Diodes

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Replaced

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Life cycle

NOW

WITHDRAWN
IEC 60147-5:1977 ED1
99.60 Withdrawal effective
Nov 19, 2016

REVISED BY

WITHDRAWN
IEC 60749:1984 ED1