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IEC 60749-12:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency IEC 60749-12:2002 ED1

Publication date:   Apr 30, 2002

General information

99.60 Withdrawal effective   Dec 13, 2017

WPUB   

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

Revised

Language in which you want to receive the document.

Scope

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62187:2000 ED1

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

WITHDRAWN
IEC 60749-12:2002 ED1
99.60 Withdrawal effective
Dec 13, 2017

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60749-12:2002/COR1:2003 ED1

REVISED BY

PUBLISHED
IEC 60749-12:2017 ED2