IEC PAS 62187:2000 ED1

Variable frequency vibration test method IEC PAS 62187:2000 ED1

Publication date:   Aug 24, 2000

95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99 Withdrawal of Standard   Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

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Scope

The variable frequency vibration test is performed to determine the effect of vibration, within the specified frequency range, on the internal structural elements. Normally applicable to cavity-type packages.

Life cycle

NOW

WITHDRAWN
IEC PAS 62187:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-12:2002 ED1