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IEC 60749-12:2017 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency IEC 60749-12:2017 ED2

Publication date:   Dec 13, 2017

General information

60.60 Standard published   Dec 13, 2017

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-12:2002 ED1

WITHDRAWN
IEC 60749-12:2002/COR1:2003 ED1

NOW

PUBLISHED
IEC 60749-12:2017 ED2
60.60 Standard published
Dec 13, 2017