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IEC 60749-36:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state IEC 60749-36:2003 ED1

Publication date:   Feb 13, 2003

General information

60.60 Standard published   Feb 13, 2003

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

PUBLISHED
IEC 60749-36:2003 ED1
60.60 Standard published
Feb 13, 2003