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IEC 60749-5:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test IEC 60749-5:2003 ED1

Publication date:   Jan 17, 2003

General information

99.60 Withdrawal effective   Apr 10, 2017

WPUB   

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

Revised

Language in which you want to receive the document.

Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62161:2000 ED1

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

WITHDRAWN
IEC 60749-5:2003 ED1
99.60 Withdrawal effective
Apr 10, 2017

REVISED BY

WITHDRAWN
IEC 60749-5:2017 ED2