Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
WITHDRAWN
EN 60749:1999
99.60
Withdrawal effective
Jan 1, 2008
PUBLISHED
EN 60749-1:2003
WITHDRAWN
EN 60749-13:2002
WITHDRAWN
EN 60749-4:2002
WITHDRAWN
EN 60749-6:2002
PUBLISHED
EN 60749-31:2003
WITHDRAWN
EN 60749-15:2003
WITHDRAWN
EN 60749-9:2002
WITHDRAWN
EN 60749-12:2002
PUBLISHED
EN 60749-11:2002
PUBLISHED
EN 60749-14:2003
PUBLISHED
EN 60749-2:2002
WITHDRAWN
EN 60749-7:2002
PUBLISHED
EN 60749-10:2002
WITHDRAWN
EN 60749-3:2002