EN 60749-9:2002

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking EN 60749-9:2002

Publication date:   Sep 12, 2003

Scope

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.