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EN 60749-9:2002

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking EN 60749-9:2002

Publication date:   Sep 12, 2003

General information

99.60 Withdrawal effective   Apr 7, 2020

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

Buying

Withdrawn

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Scope

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-9:2002
99.60 Withdrawal effective
Apr 7, 2020

REVISED BY

PUBLISHED
EN 60749-9:2017