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EN 60749:1999

Semiconductor devices - Mechanical and climatic test methods EN 60749:1999

Publication date:   Sep 12, 2003

General information

99.60 Withdrawal effective   Jan 1, 2008

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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Scope

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Life cycle

NOW

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EN 60749:1999
99.60 Withdrawal effective
Jan 1, 2008

CORRIGENDA / AMENDMENTS

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EN 60749:1999/A2:2001

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EN 60749:1999/A1:2000

REVISED BY

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EN 60749-1:2003

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EN 60749-13:2002

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EN 60749-4:2002

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EN 60749-6:2002

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EN 60749-31:2003

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EN 60749-15:2003

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EN 60749-9:2002

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EN 60749-12:2002

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EN 60749-11:2002

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EN 60749-14:2003

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EN 60749-2:2002

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EN 60749-7:2002

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EN 60749-10:2002

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EN 60749-3:2002

Relations

Adopted from IEC 60749:1996 IDENTICAL