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EN 60749-31:2003

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) EN 60749-31:2003

Publication date:   Dec 22, 2003

General information

60.60 Standard published   Jun 20, 2003

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

PUBLISHED
EN 60749-31:2003
60.60 Standard published
Jun 20, 2003