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EN 60749:1999/A1:2000

Semiconductor devices - Mechanical and climatic test methods EN 60749:1999/A1:2000

Publication date:   Sep 12, 2003

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99.60 Withdrawal effective   Jan 1, 2008

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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