EN 60749-13:2002

Name: EN 60749-13:2002
Brand: CENELEC
SKU: EN 60749-13:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere EN 60749-13:2002

Publication date: Sep 12, 2003

General information

Current stage: 99.60 Withdrawal effective Mar 22, 2021

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Withdrawn

Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-13:2002
99.60 Withdrawal effective
Mar 22, 2021

REVISED BY

PUBLISHED
EN IEC 60749-13:2018