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EN 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere EN 60749-13:2002

Publication date:   Sep 12, 2003

General information

99.60 Withdrawal effective   Mar 22, 2021

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-13:2002
99.60 Withdrawal effective
Mar 22, 2021

REVISED BY

PUBLISHED
EN IEC 60749-13:2018