60.60 Standard published Apr 13, 2018
CENELEC
European Norm
31.080.01 Semiconductor devices in general
Published
<span lang="EN-US">IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. </span>The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
WITHDRAWN
EN 60749-13:2002
PUBLISHED
EN IEC 60749-13:2018
60.60
Standard published
Apr 13, 2018
