EN 60749-12:2002

Name: EN 60749-12:2002
Brand: CENELEC
SKU: EN 60749-12:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency EN 60749-12:2002

Publication date: Sep 12, 2003

General information

Current stage: 99.60 Withdrawal effective Jan 17, 2021

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Withdrawn

Scope

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-12:2002
99.60 Withdrawal effective
Jan 17, 2021

REVISED BY

PUBLISHED
EN IEC 60749-12:2018