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EN IEC 60749-12:2018

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency EN IEC 60749-12:2018

Publication date:   Jun 14, 2018

General information

60.60 Standard published   Mar 9, 2018

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages

This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:

a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749-12:2002

NOW

PUBLISHED
EN IEC 60749-12:2018
60.60 Standard published
Mar 9, 2018