EN 60749-4:2002

Name: EN 60749-4:2002
Brand: CENELEC
SKU: EN 60749-4:2002
Price: 16.5 EUR
Availability: InStock
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Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) EN 60749-4:2002

Publication date: Sep 12, 2003

General information

Current stage: 99.60 Withdrawal effective Apr 7, 2020

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Withdrawn

Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-4:2002
99.60 Withdrawal effective
Apr 7, 2020

REVISED BY

PUBLISHED
EN 60749-4:2017