EN 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) EN 60749-4:2017

Publication date:   Sep 20, 2017

Scope

IEC 60749-4:2017(E) provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition:

a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;

b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;

c) allowance of additional time-to-test delay or return-to-stress delay.