Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
WITHDRAWN
EN 60749-13:2002
99.60
Withdrawal effective
Mar 22, 2021
PUBLISHED
EN IEC 60749-13:2018