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IEC 60749:1984 ED1

Semiconductor devices - Mechanical and climatic test methods.

Publication date:   Dec 30, 1984

General information

99.60 Withdrawal effective   Oct 28, 1996

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60147-5:1977 ED1

WITHDRAWN
IEC 60147-5A:1981 ED1

NOW

WITHDRAWN
IEC 60749:1984 ED1
99.60 Withdrawal effective
Oct 28, 1996

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60749:1984/AMD1:1991 ED1

WITHDRAWN
IEC 60749:1984/AMD2:1993 ED1

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2