Menu

0

EN 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publication date:   Sep 12, 2003

General information

99.60 Withdrawal effective   Apr 7, 2020

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

Buying

  Withdrawn

PDF - €16.50

  English  



Buy

Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-4:2002
99.60 Withdrawal effective
Apr 7, 2020

REVISED BY

PUBLISHED
EN 60749-4:2017