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Device embedded substrate - Part 2-3: Guidelines - Design guide

60.60 Standard published

TC 91

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

60.60 Standard published

TC 91

Endurance test methods for die attach materials - Part 2: Temperature cycling test method for die attach materials applied to discrete type power electronic devices

60.60 Standard published

TC 91

Environmental testing - Part 2-83: Tests - Test Tf: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method using solder paste

40.20 DIS ballot initiated: 12 weeks

TC 91

ENVIRONMENTAL TESTING - Part 2-88: Tests – Test XD: Resistance of components and assemblies to liquid cleaning media

40.20 DIS ballot initiated: 12 weeks

TC 91

Electronic assembly, design and circuit boards - Vocabulary - Part 2: Common usage in electronic technologies as well as electronic assembly technologies

50.00 Final text received or FDIS registered for formal approval

TC 91

Circuit boards and circuit board assemblies - Design and use - Part 6-3: Land pattern design - Description of land pattern for through hole components (THT)

50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks

TC 91

Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices ED2

20.99 WD approved for registration as CD

TC 91

Device embedding assembly technology - Part 2-603: Guideline for stacked electronic module - Test method of intra-module electrical connectivity

40.99 Full report circulated: DIS approved for registration as FDIS

TC 91

Endurance test methods for die attach materials – Part 1: General specification

20.99 WD approved for registration as CD

TC 91

Endurance test methods for die attach materials – Part 3: Power cycling test method for die attach materials applied to discrete type power electronic devices

30.60 Close of voting/ comment period

TC 91

Endurance test methods for die attach materials – Part 5: Temperature cycling test methods for die attach materials (system soldering interconnection) applied to module type power electronic devices

40.60 Close of voting

TC 91