IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
WITHDRAWN
IEC PAS 62396-2:2007 ED1
WITHDRAWN
IEC TS 62396-2:2008 ED1
99.60
Withdrawal effective
Sep 27, 2012