Published
IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.
WITHDRAWN
IEC PAS 62396-2:2007 ED1
WITHDRAWN
IEC TS 62396-2:2008 ED1
WITHDRAWN
IEC 62396-2:2012 ED1
PUBLISHED
IEC 62396-2:2017 ED2
60.60
Standard published
Dec 15, 2017