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IEC TS 62396-2:2008 ED1

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems IEC TS 62396-2:2008 ED1

Publication date:   Aug 19, 2008

General information

99.60 Withdrawal effective   Sep 27, 2012

IEC

TC 107

Technical Specification

03.100.50   Production. Production management | 31.020   Electronic components in general | 49.060   Aerospace electric equipment and systems

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Replaced

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Scope

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62396-2:2007 ED1

NOW

WITHDRAWN
IEC TS 62396-2:2008 ED1
99.60 Withdrawal effective
Sep 27, 2012

REVISED BY

WITHDRAWN
IEC 62396-2:2012 ED1

PUBLISHED
IEC 62396-2:2017 ED2