IEC PAS 62396-2:2007 ED1

Name: IEC PAS 62396-2:2007 ED1
Brand: IEC
SKU: IEC PAS 62396-2:2007 ED1
Price: 181.5 EUR
Availability: InStock
Rating: 5 (86 reviews)

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems IEC PAS 62396-2:2007 ED1

Publication date: Sep 18, 2007

General information

Current stage: 99.60 Withdrawal effective Aug 19, 2008

Originator: IEC

Owner: TC 107

Type: Publicly Available Specification

ICS: 03.100.50 Production. Production management | 31.020 Electronic components in general | 49.060 Aerospace electric equipment and systems

Buying

Status: Replaced

Scope

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Life cycle

NOW

WITHDRAWN
IEC PAS 62396-2:2007 ED1
99.60 Withdrawal effective
Aug 19, 2008

REVISED BY

WITHDRAWN
IEC TS 62396-2:2008 ED1

PUBLISHED
IEC 62396-2:2017 ED2