60.60 Standard published Mar 9, 2018
CENELEC
European Norm
31.080.01 Semiconductor devices in general
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
WITHDRAWN
EN 60749-12:2002
PUBLISHED
EN IEC 60749-12:2018
60.60
Standard published
Mar 9, 2018