EN 60749-7:2002

Name: EN 60749-7:2002
Brand: CENELEC
SKU: EN 60749-7:2002
Price: 17.84 EUR
Availability: InStock
Rating: 5 (62 reviews)

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Publication date: Sep 12, 2003

General information

Current stage: 99.60 Withdrawal effective Jul 22, 2014

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Withdrawn

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Languages: English

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Scope

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-7:2002
99.60 Withdrawal effective
Jul 22, 2014

REVISED BY

PUBLISHED
EN 60749-7:2011