EN 60749-6:2002

Name: EN 60749-6:2002
Brand: CENELEC
SKU: EN 60749-6:2002
Price: 13.3 EUR
Availability: InStock
Rating: 5 (90 reviews)

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Publication date: Sep 12, 2003

General information

Current stage: 99.60 Withdrawal effective Apr 7, 2020

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Withdrawn

PDF - €13.30

Languages: English

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Scope

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

WITHDRAWN
EN 60749-6:2002
99.60 Withdrawal effective
Apr 7, 2020

REVISED BY

PUBLISHED
EN 60749-6:2017