The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
PUBLISHED
EN 60749-24:2004
60.60
Standard published
Apr 16, 2004
IN_DEVELOPMENT
prEN IEC 60749-24:2024