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EN 60749-24:2004

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST EN 60749-24:2004

Publication date:   Aug 10, 2006

General information

60.60 Standard published   Apr 16, 2004

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080   Semiconductor devices

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Scope

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

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PUBLISHED
EN 60749-24:2004
60.60 Standard published
Apr 16, 2004