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prEN IEC 60749-24:2024

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased hast prEN IEC 60749-24:2024

Publication date:   Oct 18, 2024

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40.20 DIS ballot initiated: 12 weeks   Sep 6, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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EN 60749-24:2004

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prEN IEC 60749-24:2024
40.20 DIS ballot initiated: 12 weeks
Sep 6, 2024