60.60 Standard published Aug 16, 2002
CENELEC
European Norm
31.080.01 Semiconductor devices in general
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
PUBLISHED
EN 60749-11:2002
60.60
Standard published
Aug 16, 2002