EN 60749-1:2003

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Publication date:   Dec 22, 2003

General information

60.60 Standard published   Jun 20, 2003

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749:1999/A2:2001

WITHDRAWN
EN 60749:1999/A1:2000

WITHDRAWN
EN 60749:1999

NOW

PUBLISHED
EN 60749-1:2003
60.60 Standard published
Jun 20, 2003