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Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
60.60 Standard published
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
60.60 Standard published
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
60.60 Standard published
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
60.60 Standard published
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
60.60 Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
40.60 Close of voting
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.60 Close of voting
Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module
10.99 New project approved
Guideline for Switching Reliability Evaluation procedures for Gallium Nitride Power Conversion Devices
40.60 Close of voting
Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices
10.99 New project approved
