This publication presents guidelines for evaluating the switching reliability of GaN power switches. It is applicable to planar enhancement-mode, depletion-mode, GaN integrated power solutions and cascode GaN power switches. It covers the following aspects:
a) An approach for broad coverage, using the switching locus to represent switching stress in a standardized manner.
b) The development of a lifetime model, based upon the type of application switching locus.
c) The validation of reliable operation under application-use conditions.
The publication will result in common methods for representing, evaluating and modeling the switching stress on GaN power switches, and ensuring their reliable operation in an application.
IN_DEVELOPMENT
prEN IEC 63419:2022
40.60
Close of voting
Mar 25, 2022
