EN IEC 63287-1:2021

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification EN IEC 63287-1:2021

Publication date:   Feb 17, 2022

Scope

IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.

NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.

NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.

This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous edition:
<ol style="list-style-type:lower-alpha">
<li style="text-align:justify">the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);</li>
<li style="text-align:justify">a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.</li>
</ol>