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EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans EN 60749-43:2017

Publication date:   Dec 14, 2017

General information

99.60 Withdrawal effective   Sep 29, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

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WITHDRAWN
EN 60749-43:2017
99.60 Withdrawal effective
Sep 29, 2024

REVISED BY

PUBLISHED
EN IEC 63287-1:2021