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EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile EN IEC 63287-2:2023

Publication date:   Sep 19, 2023

General information

60.60   Standard published   May 12, 2023

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

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PUBLISHED
EN IEC 63287-2:2023
60.60 Standard published
May 12, 2023




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