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Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

60.60 Standard published

TC 47/SC 47F

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

60.60 Standard published

TC 47/SC 47F

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

60.60 Standard published

TC 47/SC 47F

Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

60.60 Standard published

TC 47/SC 47F

Semiconductor die products - Part 1: Procurement and use

60.60 Standard published

TC 47

Semiconductor die products - Part 2: Exchange data formats

60.60 Standard published

TC 47

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

60.60 Standard published

TC 47

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation

60.60 Standard published

TC 47

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

60.60 Standard published

TC 47

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

60.60 Standard published

TC 47

DC or AC supplied electronic controlgear for LED modules - Performance requirements

60.60 Standard published

TC 34/SC 34C

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting

60.60 Standard published

TC 47

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

60.60 Standard published

TC 47

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting

60.60 Standard published

TC 47

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices

60.60 Standard published

TC 47

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices

60.60 Standard published

TC 47

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices

60.60 Standard published

TC 47

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7: Linear sliding mode triboelectric energy harvesting

60.60 Standard published

TC 47