0

IEC 62047-7:2011 ED1

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection IEC 62047-7:2011 ED1

Publication date:   Jun 16, 2011

General information

60.60 Standard published   Jun 16, 2011

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

Buying

Published

Language in which you want to receive the document.

Scope

IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.

Life cycle

NOW

PUBLISHED
IEC 62047-7:2011 ED1
60.60 Standard published
Jun 16, 2011