IEC PAS 62336:2002 ED1

Accelerated Moisture Resistance - Unbiased HAST

Publication date:   Aug 15, 2002

General information

99.60 Withdrawal effective   Mar 9, 2004

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

  Replaced

PDF - €24.20

  English  



Buy

Scope

Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

NOW

WITHDRAWN
IEC PAS 62336:2002 ED1
99.60 Withdrawal effective
Mar 9, 2004

REVISED BY

PUBLISHED
IEC 60749-24:2004 ED1