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IEC PAS 62336:2002 ED1

Accelerated Moisture Resistance - Unbiased HAST IEC PAS 62336:2002 ED1

Publication date:   Aug 15, 2002

General information

99.60 Withdrawal effective   Mar 9, 2004

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

NOW

WITHDRAWN
IEC PAS 62336:2002 ED1
99.60 Withdrawal effective
Mar 9, 2004

REVISED BY

PUBLISHED
IEC 60749-24:2004 ED1