IEC PAS 62187:2000 ED1

Variable frequency vibration test method

Publication date:   Aug 24, 2000

95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99 Withdrawal of Standard   Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

The variable frequency vibration test is performed to determine the effect of vibration, within the specified frequency range, on the internal structural elements. Normally applicable to cavity-type packages.

Life cycle

NOW

WITHDRAWN
IEC PAS 62187:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-12:2002 ED1