IEC PAS 62184:2000 ED1

Lead integrity test method

Publication date:   Aug 22, 2000

General information

99.60 Withdrawal effective   Aug 7, 2003

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for reassembly.

Life cycle

NOW

WITHDRAWN
IEC PAS 62184:2000 ED1
99.60 Withdrawal effective
Aug 7, 2003

REVISED BY

PUBLISHED
IEC 60749-14:2003 ED1