Determines whether solid state devices can withstand the effects of the temperature to which they will be subjected during soldering of their leads. The heat is conducted through the leads into the device package from solder heat at the reverse side of the board.
WITHDRAWN
IEC PAS 62174:2000 ED1
95.99
Withdrawal of Standard
Mar 31, 2003
WITHDRAWN
IEC 60749-15:2003 ED1