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IEC PAS 62162:2000 ED1

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

Publication date:   Aug 22, 2000

95.99 Withdrawal of Standard   May 3, 2017

General information

95.99 Withdrawal of Standard   May 3, 2017

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

Life cycle

NOW

WITHDRAWN
IEC PAS 62162:2000 ED1
95.99 Withdrawal of Standard
May 3, 2017

REVISED BY

WITHDRAWN
IEC 60749-28:2017 ED1