60.60 Standard published May 3, 2023
IEC
International Standard
31.200 Integrated circuits. Microelectronics
IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.
WITHDRAWN
IEC 61967-8:2011 ED1
PUBLISHED
IEC 61967-8:2023 ED2
60.60
Standard published
May 3, 2023